FCI announced that its PwrBlade+ power connector has completed long-term reliability tests when cross-mated with TE Connectivity’s Multi-Beam XLE connector series FCI announced that its PwrBlade+ ...
Distributed systems dealing with large currents can have their “common” ground reference see substantial local variations. In automotive electronics, for instance, electric motors during cold crank ...
STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...
Follow a real product through MIL-STD-810E testing to see how reliability growth contributes to a successful design. Despite the continuing push for commercial off the shelf (COTS) items, many ...
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