Over 50 years ago, the first commercially available SEM was unveiled. Yet, to this day no internationally accepted standard exists for the determination of SEM resolution. Further, to confuse matters ...
Atomic force microscopy (AFM) is utilized for surface measurements with atomic-level resolution — dimensions that are much beyond the highest resolution of optical microscopes. AFM is known to be a ...
With the continued quest for ever-higher performance, the unit interval (UI) for a data valid window continues to shrink. At a 1-Gbit/s rate, the UI is 1000 ps, shrinking to 200 ps at 5 Gbits/s and a ...
Periodic signal analysis enhances optics and photonics experiments using lock-in amplifiers and boxcar techniques.
In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
In our earlier article 2 we explained that thermocouples generate a voltage/charge (V OUT) and do not require any voltage or current excitation. Readers familiar with the technology can jump to the ...
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